Gate-all-around NWFETs vs. triple-gate FinFETs: Junctionless vs. extensionless and conventional junction devices with controlled EWF modulation for multi-VT CMOS
A. Veloso(IMEC), Aaron Thean(National University of Singapore), Philippe Matagne(IMEC), Eddy Simoen(IMEC), S. Brus(University of Liège), Vasile Paraschiv(IMEC), Nadine Collaert(IMEC), M. J. Cho(IMEC), K. Devriendt(IMEC), Pieter Lagrain(Imec the Netherlands), A. De Keersgieter(IMEC), Geert Hellings(IMEC), Janko Versluijs(IMEC), H. Bender(IMEC), Geert Eneman(Research Foundation - Flanders), Harold Dekkers(IMEC), Laurent Souriau(IMEC), J. Geypen(IMEC), Wen Fang(IMEC), E. Vecchio(IMEC)
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