Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
Umberto Celano(Arizona State University), Wilfried Vandervorst(Imec the Netherlands), Christophe Detavernier(Ghent University Hospital), Karl Opsomer(IMEC), Alexis Franquet(IMEC), Attilio Belmonte(IMEC), H. Bender(IMEC), Andreas Schulze(IMEC), Olivier Richard(IMEC), Ludovic Goux(IMEC), M. Jurczak(IMEC)
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