Three-Dimensional Observation of the Conductive Filament in Nanoscaled Resistive Memory Devices
Umberto Celano(Arizona State University), Wilfried Vandervorst(IMEC), Christophe Detavernier(Ghent University), Karl Opsomer(IMEC), Alexis Franquet(IMEC), Attilio Belmonte(IMEC), H. Bender(IMEC), Andreas Schulze(IMEC), Olivier Richard(IMEC), Ludovic Goux(IMEC), M. Jurczak(IMEC)
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