Origin of NBTI variability in deeply scaled pFETs
B. Kaczer(IMEC), H. Reisinger(Infineon Technologies (Germany)), Ph. Roussel(IMEC), R. Degraeve(IMEC), Tibor Grasser(TU Wien), J. Franco(KU Leuven), G. Groeseneken(KU Leuven), Lars‐Åke Ragnarsson(IMEC), Eddy Simoen(IMEC)
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