Positive and negative bias temperature instability on sub-nanometer eot high-K MOSFETs
Moonju Cho(IMEC), G. Groeseneken(KU Leuven), L.-Å. Ragnarsson(IMEC), T. Kauerauf(IMEC), B. Kaczer(IMEC), R. Degraeve(IMEC), J. Franco(KU Leuven), Philippe Roussel(IMEC), Joshua Tseng(IMEC), T. Y. Hoffmann(IMEC), M. Aoulaiche(IMEC)
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