New insights in the relation between electron trap generation and the statistical properties of oxide breakdown

R. Degraeve(IMEC), H.E. Maes(IMEC), G. Groeseneken(KU Leuven), Ph. Roussel(IMEC), Michel Depas(IMEC), R. Bellens(IMEC), J.-L. Ogier(IMEC)
IEEE Transactions on Electron Devices
April 1, 1998
10.1109/16.662800
Cited by 647

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