Statistical characterization of current paths in narrow poly-Si channels
R. Degraeve(IMEC), G. Groeseneken(KU Leuven), Jan Van Houdt(KU Leuven), Ph. Roussel(IMEC), A. Suhane(IMEC), B. Kaczer(IMEC), Gouri Sankar Kar(IMEC), Bao-Jun Tang(Beijing Institute of Technology), A. Arreghini(IMEC), M. Toledano-Luque(Universidad Complutense de Madrid), G. Van den bosch(IMEC)
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