Understanding ferroelectric Al:HfO2 thin films with Si-based electrodes for 3D applicationsKarine Florent, Jan Van Houdt, M. Popovici et al.|Journal of Applied Physics|2017Cited by 80
High performance La-doped HZO based ferroelectric capacitors by interfacial engineeringM. Popovici, Gouri Sankar Kar, Sergiu Clima et al.|2022 International Electron Devices Meeting (IEDM)|2022Cited by 48
Impact of Charge trapping on Imprint and its Recovery in HfO<sub>2</sub> based FeFETY. Higashi, Jan Van Houdt, Sergiu Clima et al.|Unknown|2019Cited by 41