A consistent model for oxide trap profiling with the Trap Spectroscopy by Charge Injection and Sensing (TSCIS) technique
Moonju Cho(IMEC), G. Groeseneken(KU Leuven), Eddy Simoen(IMEC), Jan Van Houdt(KU Leuven), B. Kaczer(IMEC), R. Degraeve(IMEC), B. Govoreanu(IMEC), Philippe Roussel(IMEC), A. Arreghini(IMEC), Mohammed Zahid(IMEC), M. Jurczak(IMEC)
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