The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
B. Kaczer(IMEC), Tibor Grasser(TU Wien), G. Groeseneken(KU Leuven), E. Bury(IMEC), Wolfgang Goes(TU Wien), Francky Catthoor(National Technical University of Athens), V. Putcha(IMEC), Ph. Roussel(IMEC), R. Degraeve(IMEC), J. Franco(KU Leuven), Michael Waltl(TU Wien), Peter Debacker(IMEC), Bertrand Parvais(IMEC), Prasanth Raghavan(Cochin University of Science and Technology), Pieter Weckx(IMEC), Marko Simicic(IMEC), G. Rzepa(TU Wien), D. Linten(IMEC), M. Cho(IMEC)
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