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BTI Reliability Improvement Strategies in Low Thermal Budget Gate Stacks for 3D Sequential IntegrationJ. Franco, B. Kaczer, Zhicheng Wu et al.|Unknown|2018Cited by 24
The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuitsB. Kaczer, Tibor Grasser, J. Franco et al.|Solid-State Electronics|2016Cited by 23