Analytical model for failure rate prediction due to anomalous charge loss of flash memories
R. Degraeve(IMEC), G. Tempel(Infineon Technologies (Germany)), G. Groeseneken(KU Leuven), Paul Hendrickx(IMEC), Jan Van Houdt(KU Leuven), F. Schuler(Infineon Technologies (Germany)), L. Haspeslagh(IMEC), M. Lorenzini(IMEC), D. Wellekens(IMEC)
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