Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash MemoriesR. Degraeve, G. Tempel, M. vanDuuren et al.|IEEE Transactions on Electron Devices|2004Cited by 90
Analytical model for failure rate prediction due to anomalous charge loss of flash memoriesR. Degraeve, G. Tempel, F. Schuler et al.|Unknown|2002Cited by 38
Statistical model for stress-induced leakage current and pre-breakdown current jumps in ultra-thin oxide layersR. Degraeve, G. Groeseneken, G. Tempel et al.|Unknown|2002Cited by 25