Integration challenges for multi-gate devices
Nadine Collaert(IMEC), S. Biescmans, Roger Loo(IMEC), Abhisek Dixit(IMEC), Werner Boullart(IMEC), G. Mannaert(IMEC), S. Locorotondo(IMEC), M. Jurczak(IMEC), Rita Vos(IMEC), S. Brus(University of Liège), Ivan Pollentier(IMEC), Yong Sik Yim(Samsung (United States)), Frederik Leys(IMEC), Anil Kottantharayil(IMEC), J. G. Lisoni(IMEC), Denis Shamiryan(IMEC), M. Demand(IMEC), D. Laidlcr, A. De Keersgieter(IMEC), Peter Verheyen(IMEC), Isabelle Ferain(IMEC), Stefan De Gendt(Imec the Netherlands), Kris Baert(Ghent University), E. Kunnen(IMEC), S. Beckx(Imec the Netherlands), M. Kim(Samsung (South Korea)), Monique Ercken(IMEC), B. Degroote(IMEC), M. W. Goodwin(Texas Instruments (United States)), R. Rooyackers(IMEC), James Snow(IMEC), F. Neuilly(IMEC), K. De Meyer(IMEC), Paul Zimmerman(Intel (United States))
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