Validation of Retention Modeling as a Trap-Profiling Technique for SiN-Based Charge-Trapping Memories
A. Suhane(IMEC), Jan Van Houdt(KU Leuven), G. Van den bosch(IMEC), R. Degraeve(IMEC), M. B. Zahid(IMEC), L. Breuil(IMEC), A. Arreghini(IMEC), K. De Meyer(IMEC), M. Jurczak(IMEC)
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