A new quantitative model to predict SILC-related disturb characteristics in flash E/sup 2/PROM devices
J. De Blauwe(IMEC), H.E. Maes(IMEC), G. Groeseneken(KU Leuven), Jan Van Houdt(KU Leuven), R. Degraeve(IMEC), Philippe Roussel(IMEC), L. Haspeslagh(IMEC), L. Deform, D. Wellekens(IMEC)
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