Applying Complementary Trap Characterization Technique to Crystalline $\gamma$-Phase-$\hbox{Al}_{2} \hbox{O}_{3}$ for Improved Understanding of Nonvolatile Memory Operation and Reliability
Mohammed Zahid(IMEC), Jan Van Houdt(KU Leuven), B. Govoreanu(IMEC), W C Wang(KU Leuven), M. Toledano-Luque(Universidad Complutense de Madrid), Daniel Ruiz Aguado(IMEC), V. V. Afanas’ev(IMEC), R. Degraeve(IMEC)
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