TID and Displacement Damage Resilience of 1T1R <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> Resistive Memories
Stephanie L. Weeden-Wright(Vanderbilt University), Ronald D. Schrimpf(Vanderbilt University), M. Jurczak(IMEC), Robert A. Weller(Vanderbilt University), Michael W. McCurdy(Vanderbilt University), M. King(Vanderbilt University), Daniel M. Fleetwood(Vanderbilt University), Nicholas C. Hooten(Vanderbilt University), A. Fantini(IMEC), R. Degraeve(IMEC), Robert A. Reed(Vanderbilt University), Dimitri Linten(IMEC), Michael L. Alles(Vanderbilt University), En Xia Zhang(Vanderbilt University), William G. Bennett(Vanderbilt University), Marcus H. Mendenhall(Vanderbilt University)
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