TID and Displacement Damage Resilience of 1T1R <formula formulatype="inline"><tex Notation="TeX">${\rm HfO}_2/{\rm Hf}$</tex></formula> Resistive MemoriesStephanie L. Weeden-Wright, Ronald D. Schrimpf, Nicholas C. Hooten et al.|IEEE Transactions on Nuclear Science|2014Cited by 31