Temperature-Switching During Irradiation as a Test for ELDRS in Linear Bipolar DevicesXiaolong Li, Shuai Yao, Jing Sun et al.|IEEE Transactions on Nuclear Science|2018Cited by 16
Focused Ion Beam Induced Effects on MOS Transistor ParametersA. N. Campbell, Marsha Abramo, William E. Vanderlinde et al.|Proceedings - International Symposium for Testing and Failure Analysis|1999Cited by 6