Competing Degradation Mechanisms in Short-Channel Transistors Under Channel Hot-Carrier Stress at Elevated Temperatures
E. Amat(Universitat Autònoma de Barcelona), G. Groeseneken(KU Leuven), X. Aymerich(Vall d'Hebron Hospital Universitari), R. Rodrı́guez(Universitat Autònoma de Barcelona), R. Degraeve(IMEC), T. Kauerauf(IMEC), M. Nafrı́a(Universitat Autònoma de Barcelona)
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