Competing Degradation Mechanisms in Short-Channel Transistors Under Channel Hot-Carrier Stress at Elevated TemperaturesE. Amat, G. Groeseneken, R. Rodrı́guez et al.|IEEE Transactions on Device and Materials Reliability|2009Cited by 47
Channel Hot-Carrier Degradation in Short-Channel Transistors With High- $k$/Metal Gate StacksE. Amat, G. Groeseneken, T. Kauerauf et al.|IEEE Transactions on Device and Materials Reliability|2009Cited by 45
Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stackE. Amat, G. Groeseneken, T. Kauerauf et al.|Microelectronic Engineering|2009Cited by 37
A comprehensive study of channel hot-carrier degradation in short channel MOSFETs with high-k dielectricsE. Amat, G. Groeseneken, R. Degraeve et al.|Microelectronic Engineering|2012Cited by 20