New insights in the relation between electron trap generation and the statistical properties of oxide breakdownR. Degraeve, H.E. Maes, G. Groeseneken et al.|IEEE Transactions on Electron Devices|1998Cited by 647
A consistent model for the thickness dependence of intrinsic breakdown in ultra-thin oxidesR. Degraeve, H.E. Maes, R. Bellens et al.|Unknown|2002Cited by 337
A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdownR. Degraeve, H.E. Maes, J.-L. Ogier et al.|IEEE Transactions on Electron Devices|1998Cited by 129
On the field dependence of intrinsic and extrinsic time-dependent dielectric breakdownR. Degraeve, H.E. Maes, G. Groeseneken et al.|Unknown|1996Cited by 49