The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET's

R. Degraeve(IMEC), H.E. Maes(IMEC), G. Groeseneken(KU Leuven), Ingrid De Wolf(IMEC)
IEEE Transactions on Electron Devices
June 1, 1997
10.1109/16.585549
Cited by 26

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