Oxide and interface degradation and breakdown under medium and high field injection conditions: A correlation studyR. Degraeve, H.E. Maes, G. Groeseneken et al.|Microelectronic Engineering|1995Cited by 42
Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxidesMahmoud Rasras, H.E. Maes, G. Groeseneken et al.|IEEE Transactions on Electron Devices|2001Cited by 39
The effect of externally imposed mechanical stress on the hot-carrier-induced degradation of deep-sub micron nMOSFET'sR. Degraeve, H.E. Maes, G. Groeseneken et al.|IEEE Transactions on Electron Devices|1997Cited by 26