A Study of Relaxation Current in High-<tex>$kappa$</tex>Dielectric Stacks
Zhen Xu(IMEC), G. Groeseneken(KU Leuven), Marc Heyns(IMEC), R. Degraeve(IMEC), E. Cartier(IBM (United States)), A. Kerber(Infineon Technologies (Germany)), S. DeGendt(IMEC), L. Pantisano(IMEC)
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