Constant current charge-to-breakdown: Still a valid tool to study the reliability of MOS structures?

T. Nigam(IMEC), H.E. Maes(IMEC), G. Groeseneken(KU Leuven), Marc Heyns(IMEC), R. Degraeve(IMEC)
Unknown
January 1, 1998
10.1109/relphy.1998.670444
Cited by 84

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