Oxide and interface degradation and breakdown under medium and high field injection conditions: A correlation study

R. Degraeve(IMEC), H.E. Maes(IMEC), G. Groeseneken(KU Leuven), Ingrid De Wolf(IMEC)
Microelectronic Engineering
June 1, 1995
10.1016/0167-9317(95)00065-g
Cited by 42

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