TDDB Reliability Prediction Based on the Statistical Analysis of Hard Breakdown Including Multiple Soft Breakdown and Wear-out
S. Sahhaf(IMEC), G. Groeseneken(KU Leuven), T. Kauerauf(IMEC), B. Kaczer(IMEC), R. Degraeve(IMEC), Ph. J. Roussel(IMEC)
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