The defect-centric perspective of device and circuit reliability — From individual defects to circuits
B. Kaczer(IMEC), Tibor Grasser(TU Wien), M. Cho(IMEC), G. Groeseneken(KU Leuven), E. Bury(IMEC), Wolfgang Goes(TU Wien), Francky Catthoor(National Technical University of Athens), Ph. Roussel(IMEC), R. Degraeve(IMEC), J. Franco(KU Leuven), Prasanth Raghavan(Cochin University of Science and Technology), Pieter Weckx(IMEC), G. Rzepa(TU Wien), D. Linten(IMEC), Halil Kükner(IMEC)
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