A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOS

Kai-Hsin Chuang(KU Leuven), Ingrid Verbauwhede(KU Leuven), E. Bury(IMEC), B. Kaczer(IMEC), R. Degraeve(IMEC), Dimitri Linten(IMEC)
IEEE Journal of Solid-State Circuits
July 12, 2019
10.1109/jssc.2019.2920714
Cited by 87

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