A Physically Unclonable Function Using Soft Oxide Breakdown Featuring 0% Native BER and 51.8 fJ/bit in 40-nm CMOSKai-Hsin Chuang, Ingrid Verbauwhede, B. Kaczer et al.|IEEE Journal of Solid-State Circuits|2019Cited by 87
Physically unclonable function using CMOS breakdown positionKai-Hsin Chuang, D. Linten, E. Bury et al.|Unknown|2017Cited by 21
A multi-bit/cell PUF using analog breakdown positions in CMOSKai-Hsin Chuang, Ingrid Verbauwhede, E. Bury et al.|Unknown|2018Cited by 19