Impact of self-heating on reliability predictions in STT-MRAM
S. Van Beek(IMEC), Gouri Sankar Kar(IMEC), Johan Swerts(IMEC), E. Bury(IMEC), Sébastien Couet(KU Leuven), D. Crotti(IMEC), Shreya Kundu(IMEC), Ph. Roussel(IMEC), R. Degraeve(IMEC), Laurent Souriau(IMEC), W. Kim(IMEC), Barry O’Sullivan(Toshiba (Japan)), F. Yasin(IMEC), D. Linten(IMEC), Siddharth Rao(IMEC)
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