Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns

B. Kaczer(IMEC), G. Groeseneken(KU Leuven), M. Jurczak(IMEC), R. Degraeve(IMEC), E. Augendre(IMEC)
Unknown
March 22, 2004
10.1109/essderc.2003.1256814
Cited by 26

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