An Assessment of the Location of As-Grown Electron Traps in$hboxHfO_2$/HfSiO Stacks

J. F. Zhang(Liverpool John Moores University), Stefan De Gendt(Imec the Netherlands), G. Groeseneken(KU Leuven), Chengzhi Zhao(Liverpool John Moores University), R. Degraeve(IMEC), M. B. Zahid(IMEC)
IEEE Electron Device Letters
September 29, 2006
10.1109/led.2006.882566
Cited by 37

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