Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability

B. Kaczer(IMEC), G. Groeseneken(KU Leuven), Mahmoud Rasras(IMEC), R. Degraeve(IMEC), Philippe Roussel(IMEC), K. Van de Mieroop(IMEC)
IEEE Transactions on Electron Devices
March 1, 2002
10.1109/16.987122
Cited by 259

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