Reliability Comparison of Triple-Gate Versus Planar SOI FETs
Felice Crupi(University of Pisa), G. Groeseneken(KU Leuven), Eddy Simoen(IMEC), Abhisek Dixit(IMEC), V. Subramanian(IMEC), B. Kaczer(IMEC), R. Degraeve(IMEC), P. Srinivasan(IMEC), M. Jurczak(IMEC)
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