The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films

B. Kaczer(IMEC), G. Groeseneken(KU Leuven), R. Degraeve(IMEC), N. Pangon(IMEC)
IEEE Transactions on Electron Devices
July 1, 2000
10.1109/16.848301
Cited by 84

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