The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide filmsB. Kaczer, G. Groeseneken, R. Degraeve et al.|IEEE Transactions on Electron Devices|2000Cited by 84
Temperature acceleration of oxide breakdown and its impact on ultra-thin gate oxide reliabilityR. Degraeve, A. Naem, B. Kaczer et al.|Unknown|1999Cited by 56
Investigation of temperature acceleration of thin oxide time-to-breakdownB. Kaczer, G. Groeseneken, R. Degraeve et al.|Microelectronic Engineering|1999Cited by 29