Consistent model for short-channel nMOSFET after hard gate oxide breakdown

B. Kaczer(IMEC), G. Groeseneken(KU Leuven), A. De Keersgieter(IMEC), Veerle Simons(IMEC), R. Degraeve(IMEC), K. Van de Mieroop(IMEC)
IEEE Transactions on Electron Devices
March 1, 2002
10.1109/16.987123
Cited by 166

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