Hole-Traps in Silicon Dioxides—Part II: Generation Mechanism

Chengzhi Zhao(Liverpool John Moores University), R. Degraeve(IMEC), G. Groeseneken(KU Leuven), J. F. Zhang(Liverpool John Moores University)
IEEE Transactions on Electron Devices
July 27, 2004
10.1109/ted.2004.831389
Cited by 41

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