Beyond interface: The impact of oxide border traps on InGaAs and Ge n-MOSFETs
Dennis Lin(IMEC), Aaron Thean(IMEC), Bin Yang(Economic Research Institute), Sonja Sioncke(IMEC), Nadine Collaert(IMEC), Matty Caymax(IMEC), Paola Favia(IMEC), A. Alian(IMEC), Krishna C. Saraswat(Stanford University), Shubhanshu Gupta(Stanford University), H. Bender(IMEC), M. L. Toledano(IMEC), Raymond Krom(IMEC), R. Degraeve(IMEC), E. Bury(IMEC)
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