Endurance degradation mechanisms in TiN\Ta2O5\Ta resistive random-access memory cells
C. Y. Chen(IMEC), M. Jurczak(IMEC), A. Redolfi(IMEC), A. Fantini(IMEC), Y. Y. Chen(University of Antwerp), R. Degraeve(IMEC), Sergiu Clima(IMEC), L. Goux(IMEC), G. Groeseneken(KU Leuven)
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