A consistent model for the hard breakdown distribution including digital soft breakdown: the noble art of area scaling

Ph. Roussel(IMEC), G. Groeseneken(KU Leuven), S. Sahhaf(IMEC), R. Degraeve(IMEC)
Microelectronic Engineering
May 31, 2007
10.1016/j.mee.2007.04.067
Cited by 19

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