Electrical and reliability characterization of metal-gate/HfO2/Ge FET’s with Si passivation

B. Kaczer(IMEC), G. Groeseneken(KU Leuven), Michel Houssa(IMEC), Frederik Leys(IMEC), Brice De Jaeger(IMEC), R. Degraeve(IMEC), Geoffrey Pourtois(IMEC), G. Nicholas(IMEC), Marc Meuris(IMEC), Koen Martens(IMEC)
Microelectronic Engineering
May 31, 2007
10.1016/j.mee.2007.04.100
Cited by 36

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