The Role of Nonidealities in the Scaling of MoS<sub>2</sub> FETs
Devin Verreck(IMEC), Iuliana Radu(IMEC), Anh Khoa Augustin Lu(Tohoku University), Alessandra Leonhardt(ASM International (Finland)), César Javier Lockhart de la Rosa(IMEC), Marc Heyns(IMEC), Goutham Arutchelvan(KU Leuven), Stefan De Gendt(Imec the Netherlands), Geoffrey Pourtois(IMEC), Daniele Chiappe(IMEC), A. Mocuta, Philippe Matagne(IMEC)
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