Relation between breakdown mode and location in short-channel nMOSFETs and its impact on reliability specifications

R. Degraeve(IMEC), G. Groeseneken(KU Leuven), A. De Keersgieter(IMEC), B. Kaczer(IMEC)
IEEE Transactions on Device and Materials Reliability
January 1, 2001
10.1109/7298.974832
Cited by 84

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