High FET Performance for a Future CMOS $\hbox{GeO}_{2}$ -Based Technology
Florence Bellenger(IMEC), Marc Heyns(IMEC), Evi Vrancken(IMEC), Michel Houssa(IMEC), Thomas Hoffmann(IMEC), Matty Caymax(IMEC), Brice De Jaeger(IMEC), J. Penaud(Fraunhofer Institute for Nondestructive Testing), Marc Meuris(IMEC), Clément Merckling(IMEC), K. De Meyer(IMEC), Laura Nyns(IMEC)
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