Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta<inf>2</inf>O<inf>5</inf>\Ta RRAM device
L. Goux(IMEC), M. Jurczak(IMEC), A. Redolfi(IMEC), T. Witters(IMEC), G. Groeseneken(KU Leuven), R. Degraeve(IMEC), C.Y. Chen(IMEC), Y.Y. Chen(IMEC), A. Fantini(IMEC), Fazhan Shi(University of Science and Technology of China)
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