Relation between breakdown mode and breakdown location in short channel NMOSFETs and its impact on reliability specifications

R. Degraeve(IMEC), G. Groeseneken(KU Leuven), A. De Keersgieter(IMEC), B. Kaczer(IMEC)
Unknown
November 13, 2002
10.1109/relphy.2001.922928
Cited by 130

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