Hot-Electron-Induced MOSFET Degradation - Model, Monitor, and ImprovementChenming Hu, K.W. Terrill, Simon Tam et al.|IEEE Journal of Solid-State Circuits|1985Cited by 342
A comparative study of advanced MOSFET conceptsC. Wann, Chenming Hu, K. Noda et al.|IEEE Transactions on Electron Devices|1996Cited by 239
Complementary silicide source/drain thin-body MOSFETs for the 20 nm gate length regimeJ. Kedzierski, Chenming Hu, Peng-Yao Xuan et al.|Unknown|2002Cited by 214
A spacer patterning technology for nanoscale CMOSYang‐Kyu Choi, Chenming Hu, Tsu-Jae King|IEEE Transactions on Electron Devices|2002Cited by 207